Jeff Kauppila, Ph.D., P.E.

About Jeff Kauppila, Ph.D., P.E.

Jeff Kauppila, Ph.D., P.E. is Chief Technology Officer at Reliable MicroSystems, LLC. Location: Franklin, Tennessee, United States.

Dr. Jeffrey Kauppila received his Ph.D. in Electrical Engineering from Vanderbilt University. Dr. Kauppila is a Research Associate Professor with Vanderbilt University’s Institute for Space and Defense Electronics (ISDE), where he works in the area of radiation effects modeling and radiation hardened design for microelectronics and electronic systems. He joined ISDE in 2003 and his research focus has centered on the development of radiation-effects-enabled compact models, integration of models with existing and custom developed process-design-kits (PDK), and the application of the radiation-enabled models in the design of radiation-hardened electronics. Dr. Kauppila has analog/mixed signal design experience in bipolar junction transistor, bulk CMOS, silicon-on-insulator CMOS, and FinFET technologies with minimum process feature sizes from from 6um to 14nm. Dr. Kauppila has over 50 technical/trade publications on radiation-aware compact modeling, technology characterization for radiation effects response, and the effects of radiation on microelectronic circuit reliability. He has also written a chapter in the textbook Extreme Environment Electronics (ed. J.D. Cressler and H.A. Mantooth). Dr. Kauppila taught the short course section entitled “Single-Event Modeling for Rad-Hard-by-Design Flows” at the 2016 IEEE NSREC. Dr. Kauppila is a licensed professional engineer in the state of Tennessee.

Skills

• Circuit Simulators
• Mixed-Signal Integrated Circuits
• IC Layout

Additional experience

• Adjoint Associate Professor

  Vanderbilt University School of Engineering

  Started September 2025

Education

• Doctor of Philosophy (Ph.D.), Vanderbilt University
• Master of Science (M.S.), Vanderbilt University